DISPOSITIVI PER LA MICROELETTRONICA GHIONE PDF

Suggested references are: G. Ghione Semiconductor Device for High-Speed Wiley (); G. Ghione Dispositivi per la Microelettronica, McGraw Hill (). Basics in solid state physics [Fonstad, Sze02, Singh, Ghione]. The pn junction Ghione, “Dispositivi per la microelettronica, Mc Graw-Hill, (Bibl. Tecn. G. Ghione, Dispositivi per la microelettronica, McGraw-Hill – J. P. Colinge, Semiconductor device physics – Muller-Kamins, Device electronics for integrated .

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Betti Beneventi 46 Electrical characteristics: In reverse bias, the built-in barrier is raised by the application of a reverse polarity bias. Betti Beneventi 9 Secondary effects 1. If biased at the Zener breakdown voltage they can serve as batteries almost fixed VD independent from I passing through the device linear scale in this example the breakdown voltage is V G.

Electronic Devices and Components

Type of Learning Activity. Betti Beneventi 40 Post-processing: Techniques for FPGA configuration. The exams consists in three oral tests, one for each part; a small project is also required for the third part. The minority carrier profile it is approximated idspositivi a linear behavior if there is no generation-recombination i. Hastings, “The art of analog layout”, Prentice Hall, Bibl. Documents Flashcards Grammar checker. Betti Beneventi 42 Post-processing: Nikolic, Digitial Integrated Circuits: The minority carrier profile is again exponential, but it microelettronicz often approximated by a linear behavior if there is no generation-recombination i.

As a result of diffusion, some dopants near the junction are depleted of free charge i.

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Dispositivi per la microelettronica – Giovanni Ghione – Google Books

In forward bias the diode is conducting, ideally as a short circuit. Betti Beneventi 31 Output of the simulation: Betti Beneventi 11 SWB: It depends on many physical parameters like doping and diffusion lengths.

Marsi, 3 cfu Logical circuits: Cautero, 3 cfu This teaching module is centered on the designa and the development of an instrument which will be used in an microeletttonica at the Elettra Synchrotron Radiation Facility. Schematics, HDL, diagrams; different abstraction levels.

Finally, is called the ideality factor, it is a number between 1 and 2; the more the generation-recombination phenomena are important, the more its values approaches 2. It consist of two regions of homogeneous semiconductor, one doped with acceptors p-type epr the other one doped with donors n-type.

ELECTRONICS II (218MI)

Betti Beneventi 45 Electrical characteristics: Normally the oral test has to be taken right after the results of the written test are provided. Carrato, 3 cfu For further textbooks please see the course web page http: The MOS “junction”[Pierret, p. Betti Microeletronica 33 Output of the simulation: A Quantum Optical Diod.

Betti Beneventi 50 Uniform doping: There are three main steps – problem specification – lessons to provide students with necessary competences and skills – actual design and development. The fact that the profiles do not appear identically symmetrical is only due to different mesh discretization carrier depletion with respect to equilibrium G. At a critical field, the carriers have enough kinetic energy to create micrkelettronica pairs by collisions with the lattice silicon atoms.

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Convergence is achieved if error is smaller than one. Course statistics – enrollment and graduations data. I libri di testo consigliati sono: It can be shown that the minority carrier concentration is exponentially decreasing from the junction line.

Practice classes will allow the students to quantitatively apply the equations derived in class on semiconductor heterostructures and for the main heterostructure devices.

DIDATTICA del Dip. di Ingegneria :: Scheda Docente РUniversità del Salento

Il corso consiste di lezioni teoriche e di esercitazioni in aula. The goal of the examination is to verify the knowledge of the topics listed in the Contents section and the capability to apply them to exercise solution. Betti Beneventi 4 The diode: Betti Beneventi 14 SDE: Marsi, 3 cfu The course, taught in English, is mandatory as an alternative to Optoelettronica for the MSc-level program in Electronic Engineering.

This information is particularly useful in case of nonconvergence, since it gives indication of where the numerical mesh could need revision G. Three IC production processes: Integrated circuit IC production technology [Hastings, chap. If the transition region between the two semiconductor types is assumed to be thin the junction is said to be abrupt or step Applications: Corsi di Studio Units. Master of science-level of the Bologna process in Electronic Engineering – Torino. Biblioteche Servizi online Webmail.