This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Note Use lowest possible test signal level which meets measurement accuracy requirement. Measurement Accuracies sheet 3 of 9. Usually, a series measurement circuit is employed for the measurement of a low impedance sample and a parallel measurement circuit for a sample of high impedance.

Rack Flange and Front Handle Kit.


The A Np provides the fol- lowing test frequencies instead of 10 step standard test frequencies unit: Same as accuracy specifi- cations. After the initial function test is performed, the A functions are automatically set for a C-D measurement and IMHz test frequency automatic initial settings.

The A Option provides contin- ous memory capability for retaining the memory of desired instrument control set- tings. The sequential diagnostic test is repeated after the Display Test.

The relationships of the combinability of subordinate parameters to major measurement parameters are summarized in Table If this is not done, wrong output mabual may be sent to the Bus. Ranging operation has actuated a range on which the measurement can net be taken at the selected test frequency.


For an “Open” condition, nothing should’ be connected; and for a short condition, a low im- pedance shorting strap or lead yp be connected across the HIGH and LOW sides of the test fixture contact blocks. However, a sample value measured in a paral- lel measurement circuit can be correlated with that of a series circuit by a simple conversion formula which considers the effect of dissipation jp. Note “RE” can not be used if reference data was not stored. The Self Test is a panel pushbutton function for elementary operator checks.

The measurement results, then, are substantially the sample values including the parasitic impedances present under the conditions necessary to connect and hold the sample. In such representa- tion, the effective resistance and effective reactance correspond to the projections of the impedance vector Z 6, that is, ,anual real R axis and the imaginary jX axis, 4275.

Note The functions and capabilities of OptionBattery Memory Backup, are installed in all A instruments with serial number J above.

Index of /~kurt/manuals/manuals/HP Agilent

4275aa Table shows available measurement ranges for both the parallel and series circuit measurement modes.

Accuracy readings in the graph represent the maximum error counts of the measurement read- outs under given measurement conditions. It calls attention to an operating procedure, practice, condition or the like, which, if not correctly performed or adhered to, could result in damage to or destruction of part or all of the product.


In the numeric displays, lesser significant digit data is represented by a small zero o figure to differentiate it from a significant figure which is represented by a large zero Note Less significant digit data identi- fy the meaningless numbers related to the uncertainty of the measure- ment result.

Provides continuous memo- rization of control settings powered by stand-by battery.

Line Voltage ond Fuse Selection. Dissipation factor together with inductance or capacitance measurement. Three kinds of contact electrode modules are in- cluded for components with either axial, radial or radial short leads. Two extra frequencies are also optionally available along with Op- tion These measurement errors can not be fully elimi- nated by the offset adjustment which permit compensating for residual factors 4275q in the test fixture used.

What are the major reasons for these changes manusl sample values?

Index of /~kurt/manuals/manuals/HP Agilent

Instruments Covered by Manual The effects of mwnual residual factors are: Typical measurement applications for semiconductor P-N and MOS junction capacitances are summarized in the tabulation below. If Data Ready is set to ON, this state is set when measure- ment data is provided. Manuap appropriate offset compensation quantity is automatically calculated everytime a meas- urement is taken. Offset adjustment ranges are: This paragraph describes the op- erating procedures for Option when using the B controller.